The University of Missouri in the US has been awarded a US patent on a way to detect counterfeit electronic components using a technique called microwave reflectometry, reports Securing Industry.
The patent notes that electronic devices have a unique electromagnetic signature, created by factors such as the layout of integrated circuits (ICs), the casing material and whether silicon is used in their construction. It describes various ways to detect counterfeits, including irradiating a device with microwaves and comparing the electromagnetic signal reflected back with a reference device. One advantage is that the test can be performed when the component is unpowered.
The approach could sit alongside other techniques used to detect counterfeit electronic components, such as physical inspection for size discrepancies, X-ray inspection, electrical testing, and decapsulation – using acids to reveal the inner workings of an IC.
Astute offers very reliable on-site labs for carrying out a range of destructive and non-destructive testing, as shown here:
Astute is a highly accredited, quality-driven procurement expert, with a list of clients that includes the world’s leading defence suppliers. Our mission is to shield you against inferior quality products and services. As such, our operations are run in accordance with quality processes including AS6081 that mitigates the risks of purchasing and supplying fraudulent/counterfeit electronic parts.
Find out more about Astute Electronics counterfeit mitigation techniques by contacting one of our experts.
